1116681

BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods-Low air pressure

standard by British-Adopted European Standard , 09/24/2002

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About This Item

 

Full Description



Cross References:
IEC 60068-2-13
EN 60068-2-13:1999


Partially replaces BS EN 60749:1999.
 

Product Details

Published:
09/24/2002
ISBN(s):
0580403971
Number of Pages:
10
File Size:
1 file , 290 KB
Product Code(s):
30064925, 30064925, 30064925
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60749-2:2002

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    Semiconductor devices. Mechanical and climatic test methods-Low air pressure

    • Most Recent

  2. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version

  3. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version