1804846

BS EN 60512-8-2:2011

Connectors for electronic equipment. Tests and measurements-Static load tests (fixed connectors). Test 8b. Static load, axial

standard by British-Adopted European Standard , 07/31/2011

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Cross References:
IEC 60512-1
IEC 60512-1-1
IEC 60512-1-100
EN 60512-1
EN 60512-1-1
EN 60512-1-100
IEC 60512-14
IEC 60529


Replaces BS 5772-5:1993 which remains current.

All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
07/31/2011
ISBN(s):
9780580621154
Number of Pages:
12
File Size:
1 file , 1000 KB
Product Code(s):
30178255, 30178255, 30178255
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60512-8-2:2011

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    Connectors for electronic equipment. Tests and measurements-Static load tests (fixed connectors). Test 8b. Static load, axial

    • Most Recent

  2. BS 5772-5:1993


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

    • Historical Version

  3. BS 5772-5 SUPPLEMENT NO. 2:1982


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Impacttests (free components), static load tests (fixed components), endurance tests and overload tests-Test 10c

    • Historical Version

  4. BS 5772-5 SUPPLEMENT NO. 1:1981


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Impacttests (free components), static load tests (fixed components), endurance tests and overload tests-Tests 7b and 10a

    • Historical Version

  5. BS 5772-5:1979


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

    • Historical Version