2063755 Preview

AS ISO 14606-2006 [ Withdrawn ]

Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

standard by Standards Australia , 10/20/2006

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • 👥
    • Immediate download
    • $52.38
    • Add to Cart
    • Printed Edition
    • Ships in 1-2 business days
    • $58.14
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $73.33
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.
 

Product Details

Edition:
1st
Published:
10/20/2006
ISBN(s):
0733777953
Number of Pages:
15
File Size:
1 file , 690 KB
Product Code(s):
10148313, 10148302, 10148310
Note:
This product is unavailable in Ukraine, Russia, Belarus