Std

CEI EN IEC 60749-5 [ Active ]

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

standard by Comitato Elettrotecnico Italiano , 04/01/2024

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Full Description

ENGLISH

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

 

Product Details

Edition:
24#
Published:
04/01/2024
Number of Pages:
18
File Size:
1 file , 1.5 MB
 

Document History

  1. CEI EN IEC 60749-5

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    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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  2. CEI EN 60749-5


    Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  3. CEI EN 60749-5


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version