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Cross References:
ISO 22493:2008
ISO 18516:2006
ISO/IEC Guide 98-3:2008
ISO 9334:2007
ISO 9335:1995
ASTM E 1217-00


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS PD ISO/TR 19319:2013

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    Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods

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  2. BS PD ISO/TR 19319:2003


    Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

    • Historical Version