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BS PD ISO/TR 19319:2003

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

standard by BSI Group , 04/05/2005

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Cross References:
ISO 18115:2001
ISO 9334:1995
ISO 9335:1995
ASTM E 1217-00

Product Details

Published:: 04/05/2005
ISBN(s):: 0580457141
Number of Pages:: 26
File Size:: 1 file , 590 KB
Product Code(s):: 30124424, 30124424, 30124424
Note:: This product is unavailable in Ukraine, Russia, Belarus

Document History

BS PD ISO/TR 19319:2013

March 2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
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BS PD ISO/TR 19319:2003

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April 2005
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- Historical Version