Std

BS 5772-5 SUPPLEMENT NO. 1:1981

Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Impacttests (free components), static load tests (fixed components), endurance tests and overload tests-Tests 7b and 10a

standard by BSI Group , 02/27/1981

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About This Item

 

Full Description

Mechanical strength impact test and electrical overload (switches) test.

All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
02/27/1981
ISBN(s):
0580120139
Number of Pages:
6
File Size:
1 file
Product Code(s):
10119988, 10119988, 10119988
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60512-9-1:2010


    Connectors for electronic equipment. Tests and measurements-Endurance tests. Test 9a. Mechanical operation

    • Most Recent

  2. BS 5772-5:1993


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

    • Historical Version

  3. BS 5772-5 SUPPLEMENT NO. 2:1982


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Impacttests (free components), static load tests (fixed components), endurance tests and overload tests-Test 10c

    • Historical Version

  4. BS 5772-5 SUPPLEMENT NO. 1:1981

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    viewing


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Impacttests (free components), static load tests (fixed components), endurance tests and overload tests-Tests 7b and 10a

    • Historical Version

  5. BS 5772-5:1979


    Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

    • Historical Version