1831686 Preview

X9 X9.100-30-2011 (R2017)

Optical Background Measurement for MICR Documents

standard by Accredited Standards Committee X9 Incorporated , 08/09/2011

View all product details

Most Recent

Track It

Language:
    • Available Formats
    •  
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $60.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

ANSI X9.100-30-2011 (R2017) is the specification of the optical measurement methodology for the parameters of reflectance, PCS, DCR, Paxel Count, and opacity which are needed for MICR documents.
 

Product Details

Published:
08/09/2011
ANSI:
ANSI Approved
Number of Pages:
35
File Size:
1 file , 770 KB