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Full Description

This document is identical to SCTE 103 2012 except for informative components which may have been updated such as the title page, NOTICE text, headers and footers. No normative changes have been made to this document.

The purpose of this test procedure is to measure the contact resistance or intimacy of contact between an F connector and the drop cable shield (outer conductor contact resistance) or the cable center conductor and the F81 barrel (inner conductor contact resistance.) This method is used to evaluate the tendency for unwanted high-resistance contacts. Depending on the application, high resistance contacts may cause excessive energy losses, overheating and possibly, in Cable Telecommunications systems, common path distortions. In any case however, it is most desirable to have contact resistance as close to zero as possible.
 

Document History

  1. SCTE 103 2018

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    Test Method for DC Contact Resistance, Drop cable to "F" Connectors and F 81 Barrels

    • Most Recent
  2. SCTE 103 2012


    Test Method for DC Contact Resistance, Drop cable to F-Connectors and F81 Barrels

    • Historical Version
  3. SCTE 103 2004


    Test Method for DC Contact Resistance, Drop cable to F-Connectors and F81 Barrels, (formerly IPS TP 405)

    • Historical Version