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SAE J1752/1_201605

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

standard by SAE International , 05/24/2016

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Full Description

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

 

Product Details

Published:
05/24/2016
File Size:
1 file , 270 KB
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This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. SAE J1752/1_202109


    Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions (Stabilized: Sep 2021)

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  2. SAE J1752/1_201605

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    Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

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  3. SAE J1752/1_200610


    Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

    • Historical Version