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About This Item

 

Full Description

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
 

Document History

  1. JEDEC JESD47L


    Stress-Test-Driven Qualification of Integrated Circuits

    • Most Recent
  2. JEDEC JESD47K

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    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  3. JEDEC JESD47J.01


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  4. JEDEC JESD47J


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  5. JEDEC JESD47I.01


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  6. JEDEC JESD47I


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  7. JEDEC JESD47H


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version
  8. JEDEC JESD 47G.01


    STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

    • Historical Version