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Full Description

The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of temperature cycling, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors that pass through it. The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
 

Document History

  1. JEDEC JESD22-A100E


    Cycled Temperature Humidity-Bias with Surface Condensation Life Test

    • Most Recent
  2. JEDEC JESD22-A100D


    CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST

    • Historical Version
  3. JEDEC JESD22-A100C

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    CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST

    • Historical Version