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JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

standard by JEDEC Solid State Technology Association , 01/01/2003

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About This Item

 

Full Description

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
 

Product Details

Published:
01/01/2003
Number of Pages:
11
File Size:
1 file , 69 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

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    COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

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