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About This Item

 

Full Description

The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
 

Document History

  1. JEDEC JESD22-A110E


    HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

    • Most Recent
  2. JEDEC JESD22-A110D


    HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

    • Historical Version
  3. JEDEC JESD 22-A110C

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    HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

    • Historical Version