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ISO/TS 10867:2010

Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

standard by International Organization for Standardization (Technical Standard) , 09/15/2010

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ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.

The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.

 

Product Details

Published:
09/15/2010
File Size:
1 file , 540 KB
Same As:
BS DD ISO/TS 10867:2010
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This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. ISO/TS 10867:2019


    Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

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    Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

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