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BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry- This is the most recent version of this document.
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BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry- This is the most recent version of this document.
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DIN ISO 11505
Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)- This is the most recent version of this document.
About This Item
Full Description
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.