1375453 Preview

IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

standard by International Electrotechnical Commission , 03/29/2007

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $190.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
 

Product Details

Edition:
1.0
Published:
03/29/2007
Number of Pages:
43
File Size:
1 file , 720 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada