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IEC 61967-4 Ed. 1.1 b:2006 [ Withdrawn ]

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION

standard by International Electrotechnical Commission , 07/27/2006

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Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
 

Product Details

Edition:
1.1
Published:
07/27/2006
Number of Pages:
65
File Size:
1 file , 2.4 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 61967-4 Ed. 2.0 b:2021


    Integrated Circuits - Measurement Of Electromagnetic Emissions - Part 4: Measurement Of Conducted Emissions - 1 Ohm/150 Ohm Direct Coupling Method

    • Most Recent

  2. IEC 61967-4 Ed. 1.1 b:2006

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    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION

    • Historical Version

  3. IEC/TR 61967-4-1 Ed. 1.0 en:2005


    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method - Application guidance to IEC 61967-4

    • Historical Version

  4. IEC 61967-4 Ed. 1.0 b:2002


    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

    • Historical Version