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About This Item

 

Full Description

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
 

Document History

  1. IEC 61967-4 Ed. 2.0 b:2021


    Integrated Circuits - Measurement Of Electromagnetic Emissions - Part 4: Measurement Of Conducted Emissions - 1 Ohm/150 Ohm Direct Coupling Method

    • Most Recent
  2. IEC 61967-4 Ed. 1.1 b:2006


    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION

    • Historical Version
  3. IEC/TR 61967-4-1 Ed. 1.0 en:2005


    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method - Application guidance to IEC 61967-4

    • Historical Version
  4. IEC 61967-4 Ed. 1.0 b:2002

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    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. IEC 61967-4 Amd.1 Ed. 1.0 b:2006


    Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method