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IEC 61326-2-1 Ed. 2.0 b:2012 [ Withdrawn ]

Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

standard by International Electrotechnical Commission , 10/02/2012

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Full Description

IEC 61326-2-1:2012 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. This second edition cancels and replaces the first edition published in 2005. This edition constitutes a technical revision. The main technical changes are: Update with respect to IEC 61326-1:2012.

This publication is to be read in conjunction withIEC 61326-1:2012.
 

Product Details

Edition:
2.0
Published:
10/02/2012
Number of Pages:
16
File Size:
1 file , 250 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 61326-2-1 Ed. 3.0 b:2020


    Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

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  2. IEC 61326-2-1 Ed. 2.0 b:2012

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    Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

    • Historical Version

  3. IEC 61326-2-1 Ed. 1.0 b:2005


    Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

    • Historical Version