1082431

IEC 61000-4-20 Ed. 1.0 b:2003 [ Withdrawn ]

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

standard by International Electrotechnical Commission , 01/29/2003

This document has been replaced. View the most recent version.

📝 Amendments Available

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $212.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe:
  • TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test);
  • TEM waveguide validation methods for EMC measurements;
  • the EUT (i.e. EUT cabinet and cabling) definition;
  • test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
  • test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
    • It has the status of a basic EMC publication in accordance with IEC Guide 107.
     

    Product Details

    Edition:
    1.0
    Published:
    01/29/2003
    Number of Pages:
    129
    File Size:
    1 file , 1.6 MB
    Note:
    This product is unavailable in Ukraine, Russia, Belarus, Canada
     

    Document History

    1. IEC 61000-4-20 Ed. 3.0 b:2022


      Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

      • Most Recent

    2. IEC 61000-4-20 Ed. 2.0 b:2010


      Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

      • Historical Version

    3. IEC 61000-4-20 Ed. 1.1 b:2007


      Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides CONSOLIDATED EDITION

      • Historical Version

    4. IEC 61000-4-20 Amd.1 Ed. 1.0 b:2006


      Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

      • Historical Version

    5. IEC 61000-4-20 Ed. 1.0 b:2003

      👀 currently
      viewing


      Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

      • Historical Version
     

    Amendments, rulings, supplements, and errata

    1. IEC 61000-4-20 Amd.1 Ed. 1.0 b:2006


      Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides