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With the increased se of digital instrumentation in industrial and commercial applications, it becomes highly essential for the engineer to become more familiar and aware of the possible sources of measurement error related to the instruments being used and their internal construction. This paper aims at providing a common terminology and error quantification in such systems. The discussion is aimed at both the user and the manufacturer of such instruments. The paper presents many performance features of modern digital measurement systems and the sources of error.Simple computer models will attempt to simulate digital measurement system components in an intuitive manner. Developing such an understanding will aid in the determination of the required tests and the interpretation of their results. The work is aimed at a better understanding of the non-sinusoidal situation and the measuring problems due to non-sinusoidal conditions. The main part of this work is the development of a solid background using modern simulation tools of one of the main components of the measurement system, namely, the data converter, and its requirements and errors. Sample data converter specifications will be illustrated based on a sample inverter waveform analysis. A new, simple, low-cost topology for a data converter suitable for such an application is also presented and its performance is assessed using simulation. The transistor level design of the chip is being carried out, and it is intended to include chip performance results in the final manuscript.

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