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ESD SP5.3.4-2022

Charged Device Model (CDM) Testing Component Level Capacitively Coupled Transmission Line Pulsing (CC-TLP) as an Alternative CDM Characterization Method

standard by EOS/ESD Association, Inc. , 2022

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Full Description

This document establishes a procedure for testing components and microcircuits, such as integrated circuits, discrete semiconductor components, and electronic modules containing more than a single component, according to its susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM like electrostatic discharge (ESD). This contact-based test method can be performed on packaged devices as well as on bare dies and wafers.

Product Details

Published:: 2022
ISBN(s):: 1585373451
ANSI:: ANSI Approved
Number of Pages:: 24
File Size:: 1 file , 590 KB
Note:: This product is unavailable in Russia, Ukraine, Belarus

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