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Full Description

The purpose (objective) of JEDEC/ESDA JS-002-2018 is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.
 

Document History

  1. ESD JS-002-2022


    ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device Model (CDM) - Device Level

    • Most Recent
  2. ESD JS-002-2018

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    ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) - Device Level

    • Historical Version
  3. JEDEC JS-002-2014


    ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) - Device Level

    • Historical Version
  4. JEDEC JESD22-C101F


    FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS

    • Historical Version
  5. JEDEC JESD22-C101E


    FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS

    • Historical Version