1109856

BS PD IEC/PAS 62276:2002

Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

standard by BSI Group , 02/05/2002

This document has been replaced. View the most recent version.

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • 👥
    • Immediate download
    • $309.88
    • Add to Cart
    • Printed Edition
    • Ships in 1-2 business days
    • $309.88
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $417.83
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description



Cross References: IEC 60758:1993*IEC 60862-1:1989*IEC 60862-2:1991*IEC 60862-3:1986*IEC 61019-1-1:1990 *IEC 61019-1-2:1993*IEC 61019-2:1995*IEC 61019-3:1991*IEC 60410*
 

Product Details

Published:
02/05/2002
ISBN(s):
0580389804
Number of Pages:
40
File Size:
1 file , 970 KB
Product Code(s):
30057441, 30057441, 30057441
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 62276:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Most Recent

  2. BS EN 62276:2013


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Historical Version

  3. BS 09/30207175 DC


    BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring method

    • Historical Version

  4. BS EN 62276:2005


    Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

    • Historical Version

  5. BS PD IEC/PAS 62276:2002

    👀 currently
    viewing


    Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

    • Historical Version