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BS EN 62276:2005

Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

standard by British-Adopted European Standard , 02/14/2006

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Cross References:
IEC 60758
IEC 60410
ISO 4287
IEC 60862-1
EN 60862-1:2003
IEC 60862-2
EN 60862-2:2002
IEC 60862-3
EN 60862-3:2003
IEC 61019-1
EN 61019-1:2005
IEC 61019-2
IEC 61019-3
EN 61019-2:2005
ASTM F657
ASTM F154-94
ASTM F533
EN 60758: 2005
EN ISO 4287:1998
 

Product Details

Published:
02/14/2006
ISBN(s):
0580470741
Number of Pages:
38
File Size:
1 file , 1000 KB
Product Code(s):
30095580, 30095580, 30095580
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 62276:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Most Recent

  2. BS EN 62276:2013


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Historical Version

  3. BS 09/30207175 DC


    BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring method

    • Historical Version

  4. BS EN 62276:2005

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    Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

    • Historical Version

  5. BS PD IEC/PAS 62276:2002


    Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

    • Historical Version