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BS EN 60749-3:2017

Semiconductor devices. Mechanical and climatic test methods-External visual examination

standard by British-Adopted European Standard , 11/24/2017

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About This Item

 

Full Description

BS EN 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.


Cross References:
EN 61340-5-1 (IEC 61340-5-1:2016) AS
IEC 62483:2013
IEC 61340-5-1:2016
IEC 60749-9:2017
EN 60749-9:2017


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
11/24/2017
ISBN(s):
9780580948930
Number of Pages:
16
File Size:
1 file , 930 KB
Product Code(s):
30344801, 30344801, 30344801
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This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60749-3:2017

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    Semiconductor devices. Mechanical and climatic test methods-External visual examination

    • Most Recent

  2. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version

  3. BS EN 60749-3:2002


    Semiconductor devices. Mechanical and climatic test methods-External visual examination

    • Historical Version

  4. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version