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BS 09/30207175 DC

BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring method

standard by BSI Group , 07/15/2009

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Cross References:
IEC 60758
IEC 60410
ISO 4287
IEC 60862-1
IEC 60862-2
IEC 60862-3
IEC 61019-1
IEC 61019-2
IEC 61019-3
ASTM F657
ASTM F154 154-94
ASTM F533
SEMI M1-1296


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Published:
07/15/2009
Number of Pages:
41
 

Document History

  1. BS EN 62276:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Most Recent

  2. BS EN 62276:2013


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Historical Version

  3. BS 09/30207175 DC

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    BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring method

    • Historical Version

  4. BS EN 62276:2005


    Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

    • Historical Version

  5. BS PD IEC/PAS 62276:2002


    Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

    • Historical Version