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About This Item

 

Full Description

1.1''This practice provides the minimum requirements for nondestructive radiographic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.

1.2''This practice covers the radiographic examination of these items to detect possible defective conditions within the sealed case, especially those resulting from sealing the lid to the case, and internal defects such as extraneous material (foreign objects), improper interconnecting wires, voids in the die attach material or in the glass (when sealing glass is used), solder defects, or physical damage.

1.3''Basis of Application'''There are areas in this practice that may require agreement between the cognizant engineering organization and the supplier, or specific direction from the cognizant engineering organization. These items should be addressed in the purchase order, contract, or inspection technique. Specific applications may require adherence to this practice in part or in full. Deviations from this practice shall be enumerated in inspection plan and approved by both cognizant engineering organization and supplier.

1.4''Units'''The values stated in inch-pound units are to be regarded as standard. No other units of measurement are included in this practice.

1.5''This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6''This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

 

Document History

  1. ASTM E1161-21

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    Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

    • Most Recent
  2. ASTM E1161-09(2014)


    Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

    • Historical Version
  3. ASTM E1161-09


    Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

    • Historical Version
  4. ASTM E1161-03


    Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

    • Historical Version
  5. ASTM E1161-95


    Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

    • Historical Version