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Full Description

This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.
 

Document History

  1. AS 2547.2.4-1988


    Semiconductor devices, Part 2.4: Integrated circuits - Interface

    • Most Recent
  2. AS 2547.2-1983


    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - General principles of measuring methods

    • Historical Version
  3. AS C366.4-1978

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    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability

    • Historical Version
  4. AS C366.2-1970


    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2: General principles of measuring methods

    • Historical Version