Browse JEDEC

Browsing

Search Results

  1. MOST RECENT

    2076671

    JEDEC JESD51-4A

    Thermal Test Chip Guideline (Wire Bond Type Chip)

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

    Historical Editions: JEDEC JESD51-4

    • 👥MULTI-USER
  2. MOST RECENT

    2074691

    JEDEC JESD8-30A

    POD125 - 1.25 V Pseudo Open Drain I/O

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

    Historical Editions: JEDEC JESD8-30

    • Redlines
    • 👥MULTI-USER
  3. MOST RECENT

    2074688

    JEDEC JESD8-21C

    POD135 - 1.35 V Pseudo Open Drain I/O

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

    Historical Editions: JEDEC JESD8-21BJEDEC JESD8-21AJEDEC JESD8-21

    • Redlines
    • 👥MULTI-USER
  4. MOST RECENT

    2075042

    JEDEC JESD230D

    NAND Flash Interface Interopability

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

    Historical Editions: JEDEC JESD230CJEDEC JESD230BJEDEC JESD230AJEDEC JESD230

    • Redlines
    • 👥MULTI-USER
  5. MOST RECENT

    2075037

    JEDEC JESD22-B110B.01

    Mechanical Shock - Device and Subassembly

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

    Historical Editions: JEDEC JESD22-B110BJEDEC JESD22-B104C (R2009)JEDEC JESD 22-B110A (R2009)

    • Redlines
    • 👥MULTI-USER
  6. MOST RECENT

    2075034

    JEDEC JESD8-33

    .05 Low Voltage Swing Terminated Logic (LVSTL05)

    standard by JEDEC Solid State Technology Association, 06/01/2019.

    Languages: English

  7. MOST RECENT

    2034708

    JEDEC JESD209-5

    Low Power Double Data Rate 5 (LPDDR5)

    standard by JEDEC Solid State Technology Association, 02/01/2019.

    Languages: English

    • 👥MULTI-USER
  8. MOST RECENT

    2033471

    JEDEC JEP118

    GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

    standard by JEDEC Solid State Technology Association, 12/01/2018.

    Languages: English

    Historical Editions: JEDEC JEP118

    • 👥MULTI-USER
  9. MOST RECENT

    2027251

    JEDEC JESD22-A117E

    ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

    standard by JEDEC Solid State Technology Association, 11/01/2018.

    Languages: English

    Historical Editions: JEDEC JESD22-A117DJEDEC JESD22-A117CJEDEC JESD 22-A117B

    • 👥MULTI-USER
  10. MOST RECENT

    2028431

    JEDEC JESD216D

    Seriel Flash Discoverable Parameters (SFDP)

    standard by JEDEC Solid State Technology Association, 11/01/2018.

    Languages: English

    Historical Editions: JEDEC JESD216CJEDEC JESD216BJEDEC JESD216A

    • 👥MULTI-USER