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SAE ARP6338A

Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

standard by SAE International , 02/08/2019

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Full Description

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.

This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.
 

Product Details

Published:
02/08/2019
File Size:
1 file , 400 KB
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This product is unavailable in Ukraine, Russia, Belarus
 

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  1. SAE ARP6338A

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    Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

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    Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits

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