1937484

MIL MIL-STD-750-3

DEPARTMENT OF DEFENSE TEST METHOD STANDARD TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999

standard by Military Specifications and Standards , 01/03/2012

📝 Amendments Available

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About This Item

 

Full Description

Part 3 of this test method standard MIL-STD-750-3 establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
 

Product Details

Published:
01/03/2012
Number of Pages:
345
File Size:
1 file , 3.1 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Amendments, rulings, supplements, and errata

  1. MIL MIL-STD-750-3 Change 1


    Transistor Electrical Test Methods for semiconductor Devices Part 3: Test Methods 3000 through 3999

  2. MIL MIL-STD-750-3 Notice 1 - Validation 1


    DEPARTMENT OF DEFENSE TEST METHOD STANDARD TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999