1762488

JEDEC JEP 122E

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

standard by JEDEC Solid State Technology Association , 03/01/2009

This document has been replaced. View the most recent version.

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $141.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $190.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.
 

Product Details

Published:
03/01/2009
Number of Pages:
94
File Size:
1 file , 1.7 MB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. JEDEC JEP122H


    Failure Mechanisms and Models for Semiconductor Devices

    • Most Recent

  2. JEDEC JEP122G


    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version

  3. JEDEC JEP 122F


    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version

  4. JEDEC JEP 122E

    👀 currently
    viewing


    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version