2081960 Preview

ISO/TS 25138:2019

Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry

standard by International Organization for Standardization (Technical Standard) , 08/01/2019

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $223.00
    • Add to Cart

Customers Who Bought This Also Bought

Identical Versions Available

 

About This Item

 

Full Description

ISO/TS 25138:2019 describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

 

Product Details

Edition:
2nd
Published:
08/01/2019
Number of Pages:
48
File Size:
1 file , 1.6 MB
Same As:
BS PD ISO/TS 25138:2019
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. ISO/TS 25138:2019

    👀 currently
    viewing


    Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry

    • Most Recent

  2. ISO/TS 25138:2010


    Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry

    • Historical Version