37265

ISO 9220:1988

Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

standard by International Organization for Standardization , 10/01/1988

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Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

 

Product Details

Published:
10/01/1988
Number of Pages:
5
File Size:
1 file , 460 KB
Same As:
BS EN ISO 9220:1995, BS EN ISO 9220:1995
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. ISO 9220:2022


    Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

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  2. ISO 9220:1988

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    Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

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