1866525

ISO 13424:2013

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

standard by International Organization for Standardization , 10/01/2013

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Full Description

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.

 

Product Details

Published:
10/01/2013
File Size:
1 file , 2.2 MB
Same As:
BS ISO 13424:2013
Note:
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