1748366

ESD TR5.4-01-00

Transient Induced Latch-Up (TLU)

standard by EOS/ESD Association, Inc. , 2000

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Full Description

This report provides a brief background on early latch-up work, reviews the issues surrounding the power supply response requirements, and discusses the efforts on RLC TLU testing, transmission line pulse (TLP) stressing, and the new bi-polar stress TLU methodology.
 

Product Details

Published:
2000
Number of Pages:
29
File Size:
1 file , 730 KB
Note:
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