2688596

CEI EN IEC 63364-1 [ Active ]

Semiconductor devices - Semiconductor devices for IoT system Part 1: Test method of sound variation detection

standard by Comitato Elettrotecnico Italiano , 05/01/2023

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ENGLISH

This part of IEC 63364 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

 

Product Details

Edition:
23#
Published:
05/01/2023
Number of Pages:
20
File Size:
1 file , 4.6 MB