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Cross References:
ISO 18115
ISO 21270
ASTM E 673-01
ASTM E 995-11
ASTM E 983-10


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS ISO 18118:2024


    Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

    • Most Recent
  2. BS ISO 18118:2015

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    Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

    • Historical Version
  3. BS ISO 18118:2004


    Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

    • Historical Version