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Cross References:
IEC 60758:2016
ISO 2859-1:1989
EN 60758:2016
IEC 60862-1
IEC 60862-2
IEC 60862-3
IEC 61019-1
IEC 61019-2
IEC 61019-3
ISO 4287:1997
ANSI/IEEE Std 176-1987
ASTM F533
SEMI M1-1296
EN 61019-1
EN 61019-2
EN 61019-3
EN ISO 4287:1998


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS EN 62276:2016

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    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Most Recent
  2. BS EN 62276:2013


    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

    • Historical Version
  3. BS 09/30207175 DC


    BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring method

    • Historical Version
  4. BS EN 62276:2005


    Single crystal wafers applied for surface acoustic wave (SAW) device applications . Specification and measuring methods

    • Historical Version
  5. BS PD IEC/PAS 62276:2002


    Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

    • Historical Version