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BS EN 62047-6:2010

Semiconductor devices. Micro-electromechanical devices-Axial fatigue testing methods of thin film materials

standard by British-Adopted European Standard , 04/30/2010

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Cross References:
IEC 62047-2:2006
EN 62047-2:2006
ASTM E 1823-05a
ISO 1099
ASTM E 466-96
ISO 6892
ISO 12107


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
04/30/2010
ISBN(s):
9780580585449
Number of Pages:
20
File Size:
1 file , 910 KB
Product Code(s):
30163303, 30163303, 30163303
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 62047-6:2010

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    Semiconductor devices. Micro-electromechanical devices-Axial fatigue testing methods of thin film materials

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  2. BS 07/30163302 DC


    BS EN 62047-6. Semiconductor devices. Micro-electromechanical devices. Part 6. Axial fatigue testing methods of thin film materials

    • Historical Version