BS EN 61338-1-5:2015: Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits, the attenuation of planar transmission lines such as striplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is standardized in this document to evaluate the conductivity of transmission line on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates. This standard describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.

This measurement method has the following characteristics:

• the interface resistance R_i is obtained by measuring the resonant frequency f₀ and unloaded quality factor Q_u of a TE_01δ mode dielectric rod resonator shown in Figure 2;
• the interface conductivity σ_i and the relative interface conductivity σ_ri = σ_i / σ₀ are calculated from the measured R_i value, where σ₀ = 5,8 × 10⁷ S/m is the conductivity of standard copper;
• the measurement uncertainty of σ_ri (Δσ_ri) is less than 5 %.

Cross References:
IEC 61338-1-3
IEC 62562
EN 61338-1-3
EN 62252


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