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Document History

  1. BS EN 60749-31:2003

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    Semiconductor devices. Mechanical and climatic test methods-Flammability of plastic-encapsulated devices (internally induced)

    • Most Recent
  2. BS EN 60749:1999


    Semiconductor devices. Mechanical and climatic test methods

    • Historical Version
  3. BS 6493-3:1985


    Semiconductor devices-Mechanical and climatic test methods

    • Historical Version