1108843

BS DD ENV 50219:1996

Description of the reliability test structures of the European mini test chip

standard by BSI Group , 09/15/1996

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About This Item

 

Full Description

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- 'Description of a Parametrized European Mini Test Chip'
CENELEC R 117- 'Data Interchange Format for Simulated and Measured Data (ISMD)'
CENELEC 'R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip'
CENELEC R 117- 'Evaluation of the Reliability Test Structures of the European Mini Test Chip'
 

Product Details

Published:
09/15/1996
ISBN(s):
0580260372
Number of Pages:
38
File Size:
1 file , 980 KB
Product Code(s):
835677, 835677, 00835677
Note:
This product is unavailable in Ukraine, Russia, Belarus