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About This Item

 

Full Description

Specifies the terms, definitions, symbols, test methods and other material for monolithic integrated circuits necessary to prepare appropriate detail specifications in the CECC system.

Cross References:
BS 2011
BS 3363
BS 3934
BS 3939:Part 12
BS 3939:Part 13
BS 5555
BS 6001:Part 1
BS 6100:Section 3.6
BS 6493:Section 1.1
BS 6493:Section 2.1
BS 6493:Section 2.2
BS 6493:Section 2.3
BS 6493:Section 2.4
BS 6493:Part 3
BS 9400
BS 9970:Part 0
BS CECC 00012
BS CECC 90100
BS CECC 90103
BS CECC 90104
BS CECC 90109
BS CECC 90200
BS CECC 90300
ISO 2015
IEC 27
IEC 27-1
IEC 134
IEC 355
IEC 653
CECC 00 102
CECC 00 107
CECC 00 109
CECC 00 200


Replaces BS CECC 90000:1985 and BS CECC 90000:Addendum 1:1983 which remain current due to existing approvals.

Replaced by BS EN 190000:1996 but remains current due to existing approvals.

Incorporates the following:
AMD 7386 published 15 January 1993
 

Document History

  1. BS EN 190000:1996


    Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

    • Most Recent
  2. BS 9400:1970


    Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test

    • Historical Version
  3. BS CECC 90000:1991

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    Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

    • Historical Version
  4. BS CECC 90000:1985


    Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

    • Historical Version