Language:
    • Available Formats
    •  
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • Immediate download
    • $114.48
    • Add to Cart
    • Printed Edition
    • Ships in 1-2 business days
    • $138.44
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $154.76
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Document History

  1. DIN EN 62047-17


    Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015); German version EN 62047-17:2015

    • Most Recent
  2. DIN EN 62047-17 - DRAFT

    👀currently
    viewing


    Draft Document - Semiconductor devices - Micro- electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin film (IEC 47F/78/CD:2011)

    • Historical Version