1612111

ISO 18117:2009

Surface chemical analysis - Handling of specimens prior to analysis

standard by International Organization for Standardization , 03/15/2009

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Full Description

ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.

 

Product Details

Published:
03/15/2009
File Size:
1 file , 170 KB
Same As:
BS ISO 18117:2009, BS ISO 18117:2009
Note:
This product is unavailable in Ukraine, Russia, Belarus