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ISO 21270:2004

Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

standard by International Organization for Standardization , 06/01/2004

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Full Description

ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.

 

Product Details

Published:
06/01/2004
Number of Pages:
13
File Size:
1 file , 300 KB
Same As:
BS ISO 21270:2004, BS ISO 21270:2004
Note:
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