1125346

ISO 6342:2003

Micrographics - Aperture cards - Method of measuring thickness of buildup area

standard by International Organization for Standardization , 07/01/2003

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Full Description

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

 

Product Details

Published:
07/01/2003
Number of Pages:
3
File Size:
1 file , 130 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus